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Sarin Incorporates GIA Cut Grading System into Products  |  |
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Sarin Incorporates GIA Cut Grading System into Planning and Grading Software, Will Conduct Seminars Worldwide About Support Tools for New GIA System
[Tel Aviv, Israel, AUGUST 2, 2005] Following the official launch yesterday by the Gemological Institute of America (GIA) of its new Cut Grading System, Sarin Technologies has announced that it is releasing upgraded versions of its DiaVision™ software for diamond grading and re-cutting polished diamonds and its Advisor™ software for planning rough diamonds, both of which will now incorporate the GIA Facetware™, facilitating the cut grading criteria introduced by GIA. The products, therefore, are now equipped to serve as technological support tools for the Diamond Grading System.
“We have invested many years of work in ensuring that the new GIA cut grading system is properly incorporated in our products,” explained Sarin CEO Zeev Leshem, “We are proud to offer GIA Facetware™ as a significant upgrade option to our clients, enabling them to adapt efficiently to the criteria being introduced by GIA.”
To help educate the trade about the technology supporting the new GIA Cut Grading System and to provide information about how members of diamond industry can incorporate the GIA Cut Grade into their decision-making strategies, Sarin Technologies, in cooperation with GIA, will conduct a series of special seminars in all major jewelry and gemstone centers during August, September, and October. They include Ramat Gan, Israel; Moscow, Russia; Antwerp, Belgium; Hong Kong, PRC; Tokyo, Japan; New York, USA; and Mumbai, India. Interested parties may contact Sarin’s local offices for further details on seminar locations and times.
Go to the GIA Facetware product page.
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